BS EN 60747-5-5 : 2011
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 5-5: OPTOELECTRONIC DEVICES - PHOTOCOUPLERS
Hardcopy , PDF
English
01-01-2015
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1 Scope
2 Normative references
3 Photocoupler
4 Terms related to ratings and
characteristics for photocouplers
5 Terms for photocoupler providing
protection against electrical shock
6 Electrical characteristics
7 Photocouplers providing protection
against electrical shock
8 Measuring methods for photocouplers
9 Testing methods of electrical rating
for phototriac coupler
Annex A (normative) - Input/output safety test
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Provides the terminology, essential ratings, characteristics, safety tests as well as the measuring methods for photocouplers (or optocouplers).
| Committee |
EPL/47
|
| DevelopmentNote |
Partially supersedes BS EN 60747-5-1, BS EN 60747-5-2 and BS EN 60747-5-3. Supersedes 02/211631 DC. (06/2011) 2011 Edition Re-Issued in June 2015 & incorporates AMD 1 2015. Supersedes 14/30313278 DC & 11/30253197 DC. (06/2015)
|
| DocumentType |
Standard
|
| Pages |
60
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-5-5:2007+AMD1:2013 CSV | Identical |
| EN 60747-5-5:2011/A1:2015 | Identical |
| IEC 60112:2003+AMD1:2009 CSV | Method for the determination of the proof and the comparative tracking indices of solid insulating materials |
| IEC 60270:2000+AMD1:2015 CSV | High-voltage test techniques - Partial discharge measurements |
| EN 60216-1:2013 | Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results |
| EN 60747-5-2:2001/A1:2002 | DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-2: OPTOELECTRONIC DEVICES - ESSENTIAL RATINGS AND CHARACTERISTICS |
| IEC 60068-1:2013 | Environmental testing - Part 1: General and guidance |
| IEC 60068-2-58:2015+AMD1:2017 CSV | Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD) |
| IEC 60068-2-27:2008 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| EN 60065:2014/AC:2017-01 | AUDIO, VIDEO AND SIMILAR ELECTRONIC APPARATUS - SAFETY REQUIREMENTS (IEC 60065:2014/COR2:2016) |
| EN 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| EN 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| EN 60068-1:2014 | Environmental testing - Part 1: General and guidance |
| EN 60747-5-3:2001/A1:2002 | DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-3: OPTOELECTRONIC DEVICES - MEASURING METHODS |
| IEC 60216-2:2005 | Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria |
| EN 60747-5-1:2001/A2:2002 | DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - PART 5-1: OPTOELECTRONIC DEVICES - GENERAL |
| IEC 60747-5-2:1997+AMD1:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics |
| EN 60270:2001/A1:2016 | HIGH-VOLTAGE TEST TECHNIQUES - PARTIAL DISCHARGE MEASUREMENTS (IEC 60270:2000/A1:2015) |
| IEC 60747-5-3:1997+AMD1:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods |
| EN 60112 : 2003 AMD 1 2009 | METHOD FOR THE DETERMINATION OF THE PROOF AND THE COMPARATIVE TRACKING INDICES OF SOLID INSULATING MATERIALS |
| EN 60216-2:2005 | Electrical insulating materials - Thermal endurance properties - Part 2: Determination of thermal endurance properties of electrical insulating materials - Choice of test criteria |
| EN 60068-2-27:2009 | Environmental testing - Part 2-27: Tests - Test Ea and guidance: Shock |
| EN 60068-2-17:1994 | Environmental testing - Part 2: Tests - Test Q: Sealing |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60068-2-2:2007 | Environmental testing - Part 2-2: Tests - Test B: Dry heat |
| EN 60664-1:2007 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |
| IEC 60672-2:1999 | Ceramic and glass insulating materials - Part 2: Methods of test |
| EN 60068-2-78:2013 | Environmental testing - Part 2-78: Tests - Test Cab: Damp heat, steady state |
| EN 60068-2-6:2008 | Environmental testing - Part 2-6: Tests - Test Fc: Vibration (sinusoidal) |
| IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV | Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General |
| IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
| EN 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
| EN 60695-11-5:2017 | Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance |
| IEC 60695-11-5:2016 | Fire hazard testing - Part 11-5: Test flames - Needle-flame test method - Apparatus, confirmatory test arrangement and guidance |
| IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60664-1:2007 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |
| EN 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
| IEC 60216-1:2013 | Electrical insulating materials - Thermal endurance properties - Part 1: Ageing procedures and evaluation of test results |
| EN 60672-2:2000 | Ceramic and glass insulating materials - Part 2: Methods of test |
| IEC 60068-2-30:2005 | Environmental testing - Part 2-30: Tests - Test Db: Damp heat, cyclic (12 h + 12 h cycle) |
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