BS EN 114000:1993
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes
Hardcopy , PDF
English
30-11-1984
Foreword
Preface
Section 1 - Scope
Section 2 - General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Marking
Section 3 - Quality assessment procedures
3.1 Primary stage of manufacture
3.2 Structurally similar devices
3.3 Qualification approval procedures
3.4 Supplementary procedure for qualification approval
3.5 Quality conformance inspection
3.6 Sampling requirement for small lots or expensive
items
3.7 Re-submission of rejected lots
3.8 Certified test records
3.9 Delayed delivery
3.10 Unchecked parameters
3.11 Periodic inspection
3.12 Release for delivery before the completion of
Group B tests
Section 4 - Test and measurement procedures
4.1 Standard conditions for testing
4.2 Alternative test methods
4.3 Visual examination
4.4 Dimensions
4.5 Electrical test and measurement procedures
4.6 Mechanical test and measurement procedures
4.7 Environmental test and measurement procedures
4.8 Endurance test methods
General details, quality assessment procedures and test and measurement procedures.
Committee |
EPL/100
|
DevelopmentNote |
Renumbers and supersedes BS CECC14000(1984). 1993 Version incorporates amendment 7575 to BS CECC14000(1984). Supersedes 80/29001 DC. Also numbered as CECC 14000. (08/2005)
|
DocumentType |
Standard
|
Pages |
32
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
Standards | Relationship |
IEC 60306-4:1971 | Similar to |
NEN EN 114000 : 2004 | Identical |
I.S. EN 114000:1994 | Identical |
EN 114000 : 1991 | Identical |
DIN EN 114000:1996-10 | Identical |
EN 114000:1991 | Identical |
BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
CECC 00109 : 1974 | CECC RULES OF PROCEDURE: RP 9: CERTIFIED TESTS RECORDS |
IEC 60462:2010 | Nuclear instrumentation - Photomultiplier tubes for scintillation counting - Test procedures |
CECC 00107(PT3) : 80 AMD 1 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR CAPABILITY APPROVAL |
IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
IEC 60151-1:1963 | Measurements of the electrical properties of electronic tubes and valves - Part 1: Measurement of electrode current |
IEC 60306-1:1969 | Measurement of photosensitive devices - Part 1: Basic recommendations |
BS 3939-29(1975) : LATEST | |
BS 4727(1971) : LATEST | |
CECC 00107(PT2) : 79 AMD 1 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - PROCEDURE FOR ENHANCED ASSESSMENT OF QUALITY |
BS 448-1:1981 | Dimensions of electronic tubes and valves IEC dimensions |
IEC 60151-5:1964 | Measurements of the electrical properties of electronic tubes and valves - Part 5: Methods of measuring hiss and hum |
CECC 00107(PT1) : 1982 | CECC RULES OF PROCEDURE: RP7: QUALITY ASSESSMENT PROCEDURES - QUALITY ASSESSMENT PROCEDURE FOR GENERAL USAGE |
BS 2011(1967) : LATEST | |
BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
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