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ASTM E 1894 : 2013-07

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

GUIDE FOR SELECTING DOSIMETRY SYSTEMS FOR APPLICATION IN PULSED X-RAY SOURCES

Superseded date

28-06-2015

Published date

01-07-2013

CONTAINED IN VOL. 12.02, 2015 Gives assistance in the selecting and using dosimetry systems in flash x-ray experiments.

Committee
E 10
DocumentType
Redline
PublisherName
American Society for Testing and Materials
Status
Superseded

ASTM F 1467 : 2011-10 GUIDE FOR USE OF AN X-RAY TESTER ([APPROXIMATE] 10 KEV PHOTONS) IN IONIZING RADIATION EFFECTS TESTING OF SEMICONDUCTOR DEVICES AND MICROCIRCUITS
ASTM F 980 : 2016 : REDLINE Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
ASTM F 773M : 2016 : REDLINE Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
ASTM F 744M : 2016 : REDLINE Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
ASTM F 996 : 2011 : R2018 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)
ASTM F 996 : 2011 Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
ASTM F 526 : 2016 : REDLINE Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
ASTM F 1893 : 2011-02 GUIDE FOR MEASUREMENT OF IONIZING DOSE-RATE SURVIVABILITY AND BURNOUT OF SEMICONDUCTOR DEVICES

ISO/ASTM 51261:2013 Practice for calibration of routine dosimetry systems for radiation processing
ISO/ASTM 51275:2013 Practice for use of a radiochromic film dosimetry system
ASTM E 170 : 2017 : REDLINE Standard Terminology Relating to Radiation Measurements and Dosimetry
ASTM E 668 : 2013 : REDLINE Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
ASTM E 1249 : 2015 : REDLINE Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
ASTM E 666 : 2014 : REDLINE Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation

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