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ASTM E 1829 : 2014

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Standard Guide for Handling Specimens Prior to Surface Analysis

Available format(s)

Hardcopy , PDF

Superseded date

04-12-2020

Language(s)

English

Published date

04-11-2014

$122.77
Including GST where applicable

1.1 This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines.

Committee
E 42
DocumentType
Guide
Pages
5
PublisherName
American Society for Testing and Materials
Status
Superseded
SupersededBy
Supersedes

1.1This guide covers specimen handling and preparation prior to surface analysis and applies to the following surface analysis disciplines:

1.1.1Auger electron spectroscopy (AES),

1.1.2X-ray photoelectron spectroscopy (XPS or ESCA), and

1.1.3Secondary ion mass spectrometry (SIMS).

1.1.4Although primarily written for AES, XPS, and SIMS, these methods may also apply to many surface-sensitive analysis methods, such as ion scattering spectrometry, low-energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface-sensitive measurements.

1.2This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

ASTM F 2150 : 2013 Standard Guide for Characterization and Testing of Biomaterial Scaffolds Used in Tissue-Engineered Medical Products
ASTM F 2883 : 2011 Standard Guide for Characterization of Ceramic and Mineral Based Scaffolds used for Tissue-Engineered Medical Products (TEMPs) and as Device for Surgical Implant Applications (Withdrawn 2020)
ASTM E 2735 : 2014 Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E 1127 : 2008 : R2015 Standard Guide for Depth Profiling in Auger Electron Spectroscopy (Withdrawn 2024)
ASTM F 2847 : 2017 Standard Practice for Reporting and Assessment of Residues on Single-Use Implants and Single-Use Sterile Instruments
ASTM E 1078 : 2014 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1523 : 2015 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy (Withdrawn 2024)

ASTM E 1078 : 2002 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1078 : 1997 Standard Guide for Procedures for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1078 : 2014 Standard Guide for Specimen Preparation and Mounting in Surface Analysis
ASTM E 1078 : 2009 Standard Guide for Specimen Preparation and Mounting in Surface Analysis

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