ASTM E 1078 : 2014 : REDLINE
Current
The latest, up-to-date edition.
Standard Guide for Specimen Preparation and Mounting in Surface Analysis
English
01-10-2014
Important note : All end users must be registered with an Account prior to user licenses being assigned.CONTAINED IN VOL. 03.06, 2014 Defines specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis.
| Committee |
E 42
|
| DocumentType |
Redline
|
| Pages |
11
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Current
|
1.1This guide covers specimen preparation and mounting prior to, during, and following surface analysis and applies to the following surface analysis disciplines:
1.1.1Auger electron spectroscopy (AES),
1.1.2X-ray photoelectron spectroscopy (XPS and ESCA), and
1.1.3Secondary ion mass spectrometry (SIMS).
1.1.4Although primarily written for AES, XPS, and SIMS, these methods will also apply to many surface sensitive analysis methods, such as ion scattering spectrometry, low energy electron diffraction, and electron energy loss spectroscopy, where specimen handling can influence surface sensitive measurements.
1.2The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
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