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ANSI/ESDA/JEDEC JS-002 : 2018

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

ANSI/ESDA/JEDEC JOINT STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TESTING – CHARGED DEVICE MODEL (CDM) – DEVICE LEVEL

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2019

Superseded date

14-05-2025

Free

This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).

DocumentType
Standard
ISBN
1-58537-298-6
Pages
45
PublisherName
JEDEC Solid State Technology Association
Status
Superseded
SupersededBy
Supersedes

DSCC V62/22612:2022 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
JEDEC JESD82-531A:2024 DDR5 Clock Driver Definition (DDR5CK01)
DSCC V62/P22612A:2022 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
DSCC V62/22612A:2023 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
JEDEC JESD82-513:2023 DDR5 Registering Clock Driver Definition (DDR5RCD03)
DSCC V62/23623:2025 MICROCIRCUIT, LINEAR, ENHANCED PRODUCT 2-V TO 5.5 V, LOW NOISE, HEX SCHMITTTRIGGER INVERTERS, MONOLITHIC SILICON
DSCC V62/23612:2023 MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON
JEDEC JEP30-E100A:2023 Part Model Electrical Guidelines for Electronic-Device Packages – XML Requirements
DSCC V62/24620:2024 MICROCIRCUIT, DIGITAL, HEX INVERTER BUFFERS/DRIVERS WITH OPEN-DRAIN OUTPUTS, MONOLITHIC SILICON

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