ANSI/ESDA/JEDEC JS-001:2023
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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JOINT JEDEC/ESDA STANDARD FOR ELECTROSTATIC DISCHARGE SENSITIVITY TEST - HUMAN BODY MODEL (HBM) - COMPONENT LEVEL
Hardcopy , PDF
04-11-2024
English
30-05-2023
This standard establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD).
| DocumentType |
Standard
|
| Pages |
56
|
| PublisherName |
JEDEC Solid State Technology Association
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| DSCC V62/06612B:2019 | MICROCIRCUIT, LINEAR, VOLTAGE PREREGULATOR, HIGH POWER FACTOR, MONOLITHIC SILICON |
| DSCC V62/24617:2024 | MICROCIRCUIT, DIGITAL, RADIATION-TOLERANT HEX OPEN-DRAIN BUFFERS WITH INTEGRATED TRANSLATION, MONOLITHIC SILICON |
| JEDEC JESD625C.01:2024 | Requirements for Handling Electrostatic-Discharge-Sensitive (ESDS) Devices |
| DSCC V62/23628:2024 | MICROCIRCUIT, DIGITAL, RADIATION TOLERANT, QUADRUPLE 2-INPUT POSITIVE-NOR GATES, MONOLITHIC SILICON |
| DSCC V62/10610C:2023 | MICROCIRCUIT, LINEAR, 16 CHANNEL, CONSTANT CURRENT SINK LED DRIVER, MONOLITHIC SILICON |
| DSCC V62/24620:2024 | MICROCIRCUIT, DIGITAL, HEX INVERTER BUFFERS/DRIVERS WITH OPEN-DRAIN OUTPUTS, MONOLITHIC SILICON |
| DSCC V62/22612A:2023 | MICROCIRCUIT, BiCMOS, ULTRA-LOW-NOISE JESD204B DUAL-LOOP CLOCK JITTER CLEANER, MONOLITHIC SILICON |
| DSCC V62/18613B:2024 | MICROCIRCUIT, LINEAR, MICROPOWER COMPARATOR, MONOLITHIC SILICON |
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