ASTM B 568 : 1998 : R2009
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Test Method for Measurement of Coating Thickness by X-Ray Spectrometry
Hardcopy , PDF
11-11-2014
English
09-01-2009
CONTAINED IN VOL. 02.05, 2017 Specifies the use of X-ray spectrometry to determine thickness of metallic and some nonmetallic coatings.
Committee |
B 08
|
DevelopmentNote |
Supersedes EIA 364-48 (08/2006)
|
DocumentType |
Test Method
|
Pages |
8
|
ProductNote |
Reconfirmed 2009
|
PublisherName |
American Society for Testing and Materials
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
1.1 This test method covers the use of X-ray spectrometry to determine thickness of metallic and some nonmetallic coatings.
1.2 The maximum measurable thickness for a given coating is that thickness beyond which the intensity of the characteristic secondary X radiation from the coating or the substrate is no longer sensitive to small changes in thickness.
1.3 This test method measures the mass of coating per unit area, which can also be expressed in units of linear thickness provided that the density of the coating is known.
1.4 Problems of personnel protection against radiation generated in an X-ray tube or emanating from a radioisotope source are not covered by this test method. For information on this important aspect, reference should be made to current documents of the National Committee on Radiation Protection and Measurement, Federal Register, Nuclear Regulatory Commission, National Institute of Standards and Technology (formerly the National Bureau of Standards), and to state and local codes if such exist.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
ISO 3497:2000 | Metallic coatings Measurement of coating thickness X-ray spectrometric methods |
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