IEC TS 62607-2-1:2012
Current
The latest, up-to-date edition.
Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance
Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users
English
29-05-2012
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FOREWORD
INTRODUCTION
1 Scope
2 Terms, definitions, acronyms and
abbreviations
3 Sample preparation methods
4 Measurement of sheet resistance of
SWCNT or MWCNT films
5 Data analysis/Interpretation of results
Annex A (informative) - Case study
Bibliography
IEC/TS 62607-2-1:2012(E) which is a technical specification, provides a standardized method for categorizing a grade of commercial carbon nanotubes in terms of their electrical properties to enable a user to select a carbon nanotube material suitable for his application. The method is intended to assess whether the delivered materials from different production batches of the same production process are comparable regarding electrical properties of the final product which are related to electrical conductivity. The correlation between the measured parameters by the proposed method and a relevant product performance parameter has to be established for every application. This specification includes:
- definitions of terminology used in this document,
- recommendations for sample preparation,
- outlines of the experimental procedures to measure sheet resistance of carbon nanotubes in thin films,
- methods of interpretation of results and discussion of data analysis,
- case studies and,
- references.
| DocumentType |
Technical Specification
|
| Pages |
16
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| SAC GB/T 37152 : 2018 | Identical |
| DIN IEC/TS 62607-2-1;DIN SPEC 42607-2-1:2014-05 | Identical |
| PD IEC/TS 62607-2-1:2012 | Identical |
| PD IEC/TR 62834:2013 | IEC nanoelectronics standardization roadmap |
| IEC TS 62844:2016 | Guidelines for quality and risk assessment for nano-enabled electrotechnical products |
| 17/30355474 DC : 0 | BS IEC 62899-202-3 ED.1.0 - PRINTED ELECTRONICS - PART 202-3: MATERIALS - CONDUCTIVE INK - MEASUREMENT OF SHEET RESISTANCE OF CONDUCTIVE FILMS (CONTACTLESS METHOD) |
| IEC TR 62834:2013 | IEC nanoelectronics standardization roadmap |
| ISO/TS 80004-3:2010 | Nanotechnologies Vocabulary Part 3: Carbon nano-objects |
| IEC 62624:2009 | Test methods for measurement of electrical properties of carbon nanotubes |
| SEMI MF374 :2012(R2018) | TEST METHOD FOR SHEET RESISTANCE OF SILICON EPITAXIAL, DIFFUSED, POLYSILICON, AND ION-IMPLANTED LAYERS USING AN IN-LINE FOUR-POINT PROBE WITH THE SINGLE-CONFIGURATION PROCEDURE |
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