ISO 20188:2018
Current
Current
The latest, up-to-date edition.
Space systems — Product assurance requirements for commercial satellites
Available format(s)
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Language(s)
English
Published date
25-01-2018
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ISO 20188:2018 provides the recommended practices of product assurance (PA) requirements applicable to commercial satellite.
| Committee |
ISO/TC 20/SC 14
|
| DevelopmentNote |
Supersedes ISO/DIS 20188. (01/2018)
|
| DocumentType |
Standard
|
| Pages |
34
|
| ProductNote |
THIS STANDARD ALSO REFERS TO ESCC QPL,ECSS-Q-ST-60C Rev.2,ECSS-Q-ST-30C,ECSS-Q-ST-80C,ECSS-Q-70-36,GSFC-PPL-21,GSFC EEE-INST-002,AS 9100
|
| PublisherName |
International Organization for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| BS ISO 20188:2018 | Identical |
| ISO 14621-1:2003 | Space systems Electrical, electronic and electromechanical (EEE) parts Part 1: Parts management |
| ISO 10795:2011 | Space systems Programme management and quality Vocabulary |
| MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
| NASA STD 8739.3 : 1998 | SOLDERED ELECTRICAL CONNECTIONS |
| ISO 23460:2011 | Space projects — Programme management — Dependability assurance requirements |
| ISO/IEC 33001:2015 | Information technology Process assessment Concepts and terminology |
| MIL-PRF-19500 Revision P:2010 | SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR |
| MIL-STD-1547 Revision B:1992 | ELECTRONIC PARTS, MATERIALS, AND PROCESSES FOR SPACE VEHICLES |
| ISO 14300-2:2011 | Space systems — Programme management — Part 2: Product assurance |
| MIL-PRF-38534 Revision J:2015 | HYBRID MICROCIRCUITS, GENERAL SPECIFICATION FOR |
| ASTM E 595 : 2015 : REDLINE | Standard Test Method for Total Mass Loss and Collected Volatile Condensable Materials from Outgassing in a Vacuum Environment |
| ISO 10794:2011 | Space systems Programme management Material, mechanical parts and processes |
| MIL-STD-1686 Revision C:1995 | ELECTROSTATIC DISCHARGE CONTROL PROGRAM FOR PROTECTION OF ELECTRICAL AND ELECTRONIC PARTS, ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY INITIATED EXPLOSIVE DEVICES) |
| MIL-M-38510 Revision J:1991 | MICROCIRCUITS, SPECIFICATION FOR |
| MIL-STD-750 Revision F:2011 | TEST METHODS FOR SEMICONDUCTOR DEVICES |
| ISO 23461:2010 | Space systems Programme management Non-conformance control system |
| SAE AS 9100D : 2016 | QUALITY MANAGEMENT SYSTEMS - REQUIREMENTS FOR AVIATION, SPACE AND DEFENSE ORGANIZATIONS |
| MIL-STD-1246 Revision C:1994 | PRODUCT CLEANLINESS LEVELS AND CONTAMINATION CONTROL PROGRAM |
| ISO 27025:2010 | Space systems — Programme management — Quality assurance requirements |
| NASA STD 8739.4 : 2016 | WORKMANSHIP STANDARD FOR CRIMPING, INTERCONNECTING CABLES, HARNESSES, AND WIRING |
| MIL-HDBK-217 Revision F:1991 | RELIABILITY PREDICTION OF ELECTRONIC EQUIPMENT |
| ISO 14620-1:2002 | Space systems Safety requirements Part 1: System safety |
| ISO 14644-1:2015 | Cleanrooms and associated controlled environments Part 1: Classification of air cleanliness by particle concentration |
| ISO 14621-2:2003 | Space systems Electrical, electronic and electromechanical (EEE) parts Part 2: Control programme requirements |
| MIL-STD-1580 Revision B:2003 | DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| ISO 15388:2012 | Space systems — Contamination and cleanliness control |
| ISO 17666:2016 | Space systems — Risk management |
| ISO 10007:2017 | Quality management — Guidelines for configuration management |
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